JJAP Conference Proceedings

JJAP Conf. Proc. 8, 011004 (2020) doi:10.7567/JJAPCP.8.011004

Photoreflectance Spectra of Highly-oriented Mg2Si(111)//Si(111) Films

Y. Terai1, H. Hoshida1, R. Kinoshita1, A. Shevlyagin2, I. Chernev2, A. Gouralnik2

  1. 1Department of Computer Science and Electronics, Kyushu Institute of Technology, Iizuka, Fukuoka 820-8502, Japan
  2. 2Institute of Automation and Control Processes FEB RAS, Vladivostok, Russia
  • Received January 18, 2020
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Abstract

Direct transition energies of Mg2Si were obtained by photoreflectance (PR) spectra of a highly-oriented Mg2Si(111)//Si(111) film. In the PR spectra at 9 K, direct transition energies of E1 = 2.38 eV, E2 = 2.58 eV, E3 = 2.69 eV, and E4 = 2.82 eV were observed. In the temperature dependence of PR spectra, E1 and E2 shifted to lower energy at high temperatures, but there was no temperature dependence of transition energies in E3 and E4. These results showed that the temperature dependences of band structure in Mg2Si differ at direct transition points.

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